Scanning Electron Microscopy and X-Ray Microanalysis

Koleksi

Katalog

Scanning Electron Microscopy and X-Ray Microanalysis
20.21.344 - Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C.

Barcode

20.21.344-1

Kondisi

Tersedia

Tanggal masuk

22 April 2020

Unit

Asal penerimaan

Beli

Pemasok

Harga pembelian

Jenis katalog

Buku - Elektronik (E-Book)

Lokasi

Tel-U Bandung - Gedung Manterawu Lantai 5